Scanning electron microscope X-ray sourceSpecifically designed for electron microscopyX-ray source, ideal for SEMsXRF spectroscopy, is idealXRF Ray SourcewithX-ray fluorescence spectrometer X-ray source.
The SEM X-ray source has a tight profileMinato's design and sliding mounting feature allow for very close proximity to the sample. Orientation produces high "flux" (X-rays) in small to large excitation regions on the sample surface. Scanning electron microscope X-ray sourceThe xsemtm offers an excitation area of 500 to 25 mm. The integrated high-voltage power supply is 10 watts (35 kV and 0.).1 mA, depending on the anode material). Tight coupling provides XRF analysis results comparable to traditional "benchtop" or "standalone" cells. Scanning electron microscope X-ray sourceThe X-SEMTM design does not interfere with the proper functioning of the electron microscope, including the use of an electron beam on the same sample while collecting all elements simultaneously. No special cooling is required.
The electron beam (from the scanning electron microscope) produces a very high background to hide trace elements in the sample. X-rays from a true "X-ray" source do not have this effect. useScanning electron microscope X-ray sourceXsemtm can easily identify, quantify, and even generate trace X-ray maps to see the elemental distribution of trace elements in a sample.
Application: Art & Archaeology Petroleum EDXRF
Chemical Pharmaceutical Applications.
Coatings & Films Plastics, polymers and rubbers.
Cosmetics Plating and plating baths.
Environmental wood treatment applications.
Food Applications Other applications.
Forensics. Metals and ores.
Minerals and mineral products.