Agilent 4155C 4156C Semiconductor Parameter Analyzer.
Agilent 4155B Semiconductor Tester Agilent Digital Scan Parameter Analyzer, Reliable Tester, Powerful Fault Analysis Tools, Automatic Inspection Facility;Survive synthesis into the same parametric instrument.
The design goal of the new products is clearly aimed at providing unprecedented accuracy for the evaluation of submicron geometrically sized devices.
It is a flexible instrument that can be used for everything from material evaluation to device characterization to post-packaging.
Partial inspections and on-site failure analysis at various stages can provide a number of applications to improve the quality of semiconductor devices.
The choice of the right solution.
The Agilent 4155B has four built-in source monitoring units (SMUs) and two voltage units (VSU).
With two voltage monitoring units (VMUs), the 4155B is an excellent choice for basic semiconductor connections with non-Kelvin connections, with a resolution of 10FA and a 1 V measurement range of 100mA to 100V.
The 41501B SMU and Pulse Generator Expander can be added at any time. It consists of 0v 16A grounding unit feed.
Expandable to receive two 100mA 100V SMUs or one 1A 200V SMU and two on-synchronised 40V 1 S pulsers.
Set and measure.
The Agilent 4155B can be used with a number of measurement units, including the Agilent 41501B, for step, pulse sweep, and sampling (time domain) measurements without the need for variable connections. Furthermore, stress cycling measurements, such as the injection of hot carriers, and fast EEPROM evaluations can be used for reliability evaluation.
This can be done via the front panel keys, keyboard, or gpib (scpi command) by setting the page and adding spaces.
Setup and measurement, as well as short measurements and look-up settings via the button scan function – similar to a curve plotter.
Display and analysis of measurements and analysis results on a color LCD, which can be stored by 4 graphic memory reservoirs for analysis. Compare. Powerful analysis methods make it easy to extract multiple parameters such as HFE, VTH, etc.
Once the parameter extraction conditions have been found, they can be obtained automatically using the -automatic analysis function. Output and storage.
Setting, measurement, and analysis data can be output to color plotters and printers by GPIB, Yanxing or network interface 10Base-T LAN, and can also be output through the network or 3The 5-inch disk is stored in MS-DOS or LIF format (Agilent-GL, PCL function TIF).
The output file also allows the graphics to be converted into desktop publishing software. Repetitive and automated testing.