There are many distinct differences between an EL detector and a thermal imaging EL detector. First of all, they differ in the principle of detection. The EL detector mainly infers the state and nature of the object by detecting the electrical properties of the object, such as resistance, capacitance, etc. The thermal imaging EL detector uses the thermal radiation characteristics of the object to infer the internal structure and state of the object by measuring the temperature distribution on the surface of the object.
Secondly, the range of applications of these two detectors is also different. EL testers are commonly used to detect defects and properties of conductive materials, such as metals, semiconductors, etc. The thermal imaging EL detector is mainly used to detect the defects and properties of non-conductive materials, such as plastics, composite materials, etc.
In addition, compared with the EL detector, the thermal imaging EL detector has higher detection accuracy and sensitivity, and can more accurately measure the temperature distribution and internal temperature change of the object, so it is more suitable for high-precision and high-sensitivity detection needs, such as aerospace, medical and other fields.
In addition, the ** of the EL detector and the thermal imaging EL detector are also different. EL detectors are typically lower, while thermal imaging EL detectors are relatively high due to their technical complexity and need for high-precision measurements.
To sum up, there are obvious differences between the EL detector and the thermal imaging EL detector in terms of detection principle, application range, accuracy and quality. In practical application, the appropriate detector should be selected according to the specific testing needs and material properties to achieve the best detection effect.