Jinjian provides argon ion polishing and cutting services for shale samples (ion polishing CP) + high-resolution field emission scanning electron microscope SEM observation. Argon ion polishing (CP method polishing) in Jinjian laboratory can obtain a smooth cross-section without causing mechanical damage to the sample. The following is a case study.
Flat etching and polishing function.
The left picture shows the stress damage caused by mechanical grinding and polishing to the sample can be removed by ion grinding, and the structure of two different copper can be clearly seen from the right figure.
Flat etching and polishing function.
By controlling the flat grinding time, more detailed information about the sample can be obtained.
package fa
results of experiment
sem parameter：
accelerating voltage: 1kv magnification: 600x imaging mode: back-scattered electron
package：fa ，cooling stage
sem parameter：
accelerating voltage: 1kv magnification: 2,500x imaging mode: back-scattered electron
package：fa ，cooling stage
sem parameter：
accelerating voltage: 1kv magnification: 5,000x imaging mode: back-scattered electron
package：fa ，cooling stage
sem parameter：
accelerating voltage: 1kv magnification: 10,000x imaging mode: back-scattered electron
package：fa；cooling stage
pcb board：cooling stage
die package application
results
high mag
pcb with osp layer
low mag
pcb with osp layer
high mag
tsvcentral tsv
center tsv near middle of length
low k material
Discrete devices. high mag
high mag
cu wire with pdcoating
2.5d interposer
gatanresults polished width at roi ~ 1000um
high mag
bse image “left via”
se image region 9 bse image region #
bse image region #
bse image “right via”
Metal plating. Galvanized steel.
Galvanized steel sheet - high mag