Jingfa's products cover a variety of quartz crystal resonators and crystal oscillators from low frequency to high frequency, including HC-49 S, HC-S SMD, HC-46SSMD, SMD resonators, SMD oscillators and cylindrical series, etc., which can meet the needs of different fields and different application scenarios.
As the core component of modern electronic equipment, the stability and reliability of crystal oscillator are crucial. However, the crystal oscillator will be affected by environmental factors during long-term use, resulting in performance degradation. In order to ensure the reliability and performance of the crystal oscillator, it is important to test and evaluate the aging characteristics of the crystal oscillator.
First, the test principle
The aging characteristics of the crystal oscillator are mainly based on the regular measurement and analysis of the performance parameters of the crystal oscillator. By placing the crystal oscillator in an aging environment that simulates the actual usage conditions, and periodically testing parameters such as frequency accuracy, output waveform, and phase noise, the change trend of the crystal oscillator performance can be observed. Through the analysis of these data, it is possible to evaluate the aging characteristics of the crystal oscillator, its lifetime and reliability.
Second, the test steps
1.Initial Testing:Before starting the burn-in test, a comprehensive initial test of the crystal oscillator is performed, and its performance parameters such as frequency accuracy, output waveform, and phase noise are recorded. This data will be used as a benchmark for subsequent testing.
2.Aging Environment Settings:According to the actual use environment of the crystal oscillator, the environmental conditions such as high temperature, high humidity, and high earthquake are simulated, and the crystal oscillator is placed in the aging environment.
3.Regular testing:During the aging process, the performance of the crystal oscillator is tested at regular intervals. After each test, changes in the parameters are recorded and compared with the initial data.
4.Data analysis:Statistical analysis of the test data was carried out, and the variation curve of performance parameters with aging time was plotted. Analyze the change trend of various parameters and find out the key parameters that are sensitive to aging.
5.** & Assessment:Based on the test data and observations, the aging characteristics of the crystal oscillator are evaluated and evaluated. **The degree of performance degradation of the crystal oscillator during use, evaluating its life and reliability.
6.Optimizations and improvements:Based on the test results of aging characteristics, the design, manufacturing process or packaging method of the crystal oscillator is adjusted and optimized. Improve product performance, stability and reliability.
3. Test precautions
1.Consistency of the test environment: Ensure that the environmental conditions (e.g., temperature, humidity) are consistent for each test to obtain accurate test results.
2.Accuracy of test equipment: Choose high-precision test equipment to ensure the accuracy of test results.
3.Data reliability: Statistical analysis of a large number of test data to eliminate outliers and ensure the reliability of data.
4.Relationship between temperature and frequency: Pay attention to the effect of temperature on the frequency of the crystal oscillator, especially in a high-temperature environment. Consider temperature compensation techniques to reduce the effect of temperature on frequency.
5.Safety precautions: During the aging test, the safe use temperature and voltage range of the crystal oscillator should be paid attention to to avoid damage caused by overheating or overvoltage.
Through the above professional test methods, the aging characteristics of the crystal oscillator can be accurately determined, which provides an important basis for the optimization and improvement of the product. This helps to improve the stability and reliability of the crystal oscillator and reduce the risk of electronic device failure. At the same time, this test method can also provide reference for the study of aging characteristics of other electronic components.