scd-1500Semiconductor C-V characteristic analyzer
Keywords: semiconductors, C-V characteristics, integrated circuits
scd-1500Semiconductor C-V characteristic analyzerInnovatively adopts dual CPU architecture, Linux underlying system, 10The new generation of technologies such as 1-inch capacitive touch screen, Chinese and English operation interface, built-in instructions and help, is suitable for rapid sorting of production lines, automatic integrated testing, and meeting laboratory R&D and analysis. The test frequency of semiconductor C-V characteristic analyzer is 10kHz-2MHz, and the VGS voltage can reach 40V, which is enough to meet the CV characteristic test and analysis of diodes, transistors, MOS transistors and IGBTs.
First, the main application range:
Semiconductors Power components.
Parasitic capacitance testing and C-V characteristic analysis of diodes, transistors, MOSFETs, IGBTs, thyristors, integrated circuits, optoelectronic chips, etc.
Semiconductor materials.
Wafer and C-V characterization analysis.
Liquid crystal material. Elasticity constant analysis.
Second, performance characteristics:
Channels: 2 (expandable to 6).
High Bias: VGS: 0 - 40V, VDS: 0 200V, 1500V, 3000V
Dual-CPU architecture, the shortest integration time is 056ms (1800 seconds).
10.1-inch capacitive touch screen, resolution 1280*800, Linux system.
There are three test methods: spot measurement, list scanning, and graphic scanning (option).
Four parasitic parameters (CESS, COSS, CRSS, RG) are displayed on the same screen.
Fast on-on-test cont
Integrated design: LCR + high voltage source + relay matrix.
Fast charging shortens capacitor charging time for fast testing.
Automatic delay setting.
10 levels sorting.
3. Functional characteristics
a.Single point test, 101-inch large screen, four parasitic parameters are displayed on the same screen, so that the details can be seen at a glance
10.1-inch touch screen, 1280*800 resolution, Linux system, Chinese and English operation interface, support keyboard, mouse, LAN interface, bring unparalleled convenience of operation.
The four most important parasitic parameters of MOSFETs: CESS, COSS, CRSS, RG directly display the measurement results on the same interface, and the equivalent circuit diagram of the four parameters is displayed at the same time, which is clear at a glance.
Up to 6 channels of measurement parameters can be quickly recalled and the sorting results can be displayed directly on the same interface.
b.List testing, flexible combinations
scd-1500Semiconductor C-V characteristic analyzerIt supports the testing and analysis of up to 6 channels and 4 measurement parameters, and the list scan mode supports any combination of different channels, different parameters and different measurement conditions, and can set the limit range and display the measurement results.
c.Curve sweep function (optional).
scd-1500Semiconductor C-V characteristic analyzerSupport C-V characteristic curve analysis, can achieve curve scanning in logarithmic and linear ways, and can display multiple curves at the same time: multiple curves with the same parameter and different VG; Multiple curves with the same VG and different parameters.
c.Curve sweep function (optional).
scd-1500Semiconductor C-V characteristic analyzerSupport C-V characteristic curve analysis, can achieve curve scanning in logarithmic and linear ways, and can display multiple curves at the same time: multiple curves with the same parameter and different VG; Multiple curves with the same VG and different parameters.
d.Quick and easy to set up
e.10Gear sorting and programmable handler interface
The instrument provides 10 levels of sorting, which provides the possibility of grading the quality of the customer's products, and the sorting results are directly output to the handler interface.
When connecting with automation equipment, how to configure the handler interface output has always been a difficult problem for automation customers, and the TH510 series completely visualizes the handler interface pins, input and output modes, corresponding signals, and response modes, making automation connection easier.
f.Support customization, intelligent firmware upgrade mode
scd-1500Semiconductor C-V characteristic analyzerIt is open for customers, all interfaces and instruction sets of the instrument are open design, customers can program and integrate or customize functions by themselves, and if there is no hardware change in the customized functions, they can be updated directly through firmware upgrades.
The instrument itself can be updated by upgrading the firmware without returning to the factory.
The firmware upgrade is very intelligent, which can be carried out through the system setting interface or file management interface, intelligently searching for instrument memory, external USB disks and even intra-LAN upgrade packages, and automatically upgraded.
g.Knowledge of parasitic capacitance of semiconductor components
In high-frequency circuits, the parasitic capacitance of semiconductor devices often affects the dynamic characteristics of semiconductors, so the following factors need to be considered when designing semiconductor components. The parasitic capacitance of the MOS tube will affect the operation time, driving ability and switching loss of the tube. The voltage dependence of parasitic capacitors is also crucial in circuit design, using MOSFETs as an example.
Technical parameters
1. Channels: 2 channels (expandable 6 channels).
2. Display: LCD display, touch screen.
3. Measurement parameters: C, L, X, B, R, G, D, Q, ESR, RP, and Z|、|y|
4. Test frequency: 10kHz-2MHz
5. Accuracy: 001%
6. Resolution: 10MHz 100000khz-9.99999khz
7. Voltage range: 5mvrms-2vrms
8. Accuracy: (10% set value +2mv).
9. VGS voltage40V, Accuracy: 1% Set Voltage +8mV, Resolution; 1mv(0v-±10v)
10. VDS voltage: 0 - 200V
11. Accuracy: 1% set voltage +100mV
12. 1% set voltage +100mV
13. Output impedance: 100, 2%@1khz
14. Software: C-V characteristic curve analysis, logarithmic and linear two ways to achieve curve scanning.